Jawaharlal Nehru Technological University Hyderabad 2007 M.Tech Digital Communications DIGITAL SYSTEM DESIGN - Question Paper

1.a) What is a logic probe what for it is used and list various internal digital IC faults?
b) elaborate the most common kind of external faults?
2.a) Develop an ASM chart of D flip flop and realize it using only NAND Gates.
b) explain in detail about reduction of state tables and state assignments.
3.a) discuss about the subsequent kinds of faults:
(i) stuck at faults (ii) Bridge faults (iii) temporary faults
b) Draw the circuit which realizes the function f(x) = x1x2 + x3 x4 using AND-OR gates using Boolean difference method find the test set to detect SAo fault on input line x1 of the circuit.
4.a) define the algorithmic steps involved in PODEM.
b) With an example, discuss the transition count testing method.
5.a) Distinguish ranging from Mealy and Moore machines.
b) Convert the subsequent Mealy machine into a corresponding Moore machine.
PS
A B,O E,O
B E,O D,O
C D,I A,O
D C,I E,O
E B,O D,O
6.a) define the advantages of PLA minimization and folding.
b) Design a three bit BCD to grey code converter and realize the circuit using PLA and then show that how folding will decrease the number of cross points provided on the PLA.
7.a) With examples, discuss in detail about different kinds of cross point fault that occur in PLAs.
b) With an example, discuss how test generation can be achieved in testing a PLA.
8.a) discuss the subsequent with examples:
(i) flow table (ii) state reduction.
b) With respect to an asynchronous sequential machine, discuss about minimal closed corners.

Earning:   Approval pending.