SRM University 2011 B.Tech Electronics and Communications Engineering Ec0301-electronic measurements and instrumentation - Question Paper
Btech ECE EC0301-ELECTRONIC MEASUREMENTS AND INSTRUMENTATION NOVEMBER 2011
I ilUt Snnti'ih.M
5C0W ' W-KC IRONIC Ml AS !R| MI N I S AW INS IRUMl'N IATIUN
tfe .wnfcfaftu .iJiHuttJ 0*0, fa }0(r-2atUi.unn*>
iree Hours M>\ Mari> 100
Aiviwcr Al.l Questions PART - A (10 x 2 20 Mark*)
IX-fine: Sensitivity.
Define: Precision.
Gfre the basic principle of D' Arsonval movement.
Sttfe the advantages of OVM over an analog meter.
Dnw the block diagram of a sine wave generator Where arc spectrum analysers commonly used?
What are the advantages of dual trace over dual beam CRO?
What Bthe speciality of storage oscilloscope?
What ate the three requirements of an automatic test
stem? -
*5Mtlawnsdcr?
PART-B(5* t*f Marks)
Derive the transfer function of the first order system for step 11* and ramp IP.
(OH) k Kplatn Svhcrmj* bridge ind Kelvin'* a,,We btidge in with itt advantim** and dinadviimwue*.
12 l:\plam (he hasit principle WMj operation t* ctotttodvruiimimcMf, Write the lulvttiilngcj ***' dndmntgc* of elvtrtKJy#amotT!rte ,
(OR)
b. With neat 'ketch, explain V operation of series i*iy shunt type ohmmetcr.
1J. a With neat bhx:k diagram, explain,pecuum anafrrer.
(OK)
b. With neat block diagram, expUm standard and laboratory type signal generator,
14. a. Explain in detail about the operation tf dual beam CRO.
(OR)
b. Explain the operation of X-Y recorder.
15. a. With a new diagram, explain the testing of an audio
amplifier.
(OK)
b. With $ nem sketch, explain IHM 4W interface
|
Attachment: |
| Earning: Approval pending. |
