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Bengal Engineering and Science University 2006 B.E Computer Science and Engineering Digital System Design & Implementation - Question Paper

Friday, 18 January 2013 01:50Web


the ques. paper is with the attachment.

Bx/BESUS/ CST-803/ 5/ 06

B.E. (CST) Part-IV 8th Semester Examination, 2006

Digital System Design & Implementation

(CST-803/5)

Time : 3 hours    Full Marks : 100

Answer any FIVE questions.

A

1.


A

3


L>

Fig.-l

a)    Find the set of all tests that detect the fault a s-a-0.

b)    Find the set of all tests that detect the fault b-s-a-(

c)    Find the set of all tests that detect the multiple fault {a s-a-0, b s-a-0}

d)    Find a circuit that has an undetectable stuck fault.    [5+5+5+5|

a)    Mention the major advantages of PLA design.

b)    Find minimal cost of PLA design using column folding and block folding technique of following functions,

F, = B + CE + ADE F2 = AD + BC

c)    What is shrinkage fault and appearance fault of PLA?    14+12+4]

Table-1

a)    Find the equivalence partition for the machine shown in Table-1.

b)    Find a minimum length sequence that distinguishes state A from state B.

c)    Find minimal form of above machine.

d)    Explain redundancy with circuit diagram.    |6+6+4+4]

4. a) What are the differences between Ad-hoe approach and structured approach of Design for testability?

b)    What are the advantages and disadvantages of LSSD method?

c)    What are the differences between scan path approach & LSSD approach? Explain with circuit diagram.    [4+7+9]



C

a)    Find the set of all tests that detect fault a s-a-0.

b)    Find the set of all tests that detect multiple faults (c s-a-1, a s-a-0).

c)    Find a counter example to the following statement:

"In a combinational circuit two fault f and g are functionally equivalent iff they are always detected by the same test".    [4+6+10]

6.    a) What are the advantages of Random Access scan approach in comparison to

LSSD approach of DFT?

b)    Explain different modes, of BILBO register with block diagram of 8 bit BILBO register.

c)    Explain growth fault and disappearance fault of PLA.    |5+lO+5|

7.    a) Explain stuck-open fault of CMOS circuit with diagram.

b)    What are the different stages of VHDL architecture?

c)    Explain Signature Analysis method of DFT with Block diagram. [5+7+8]







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