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Bengal Engineering and Science University 2007 B.E Computer Science and Engineering Digital System Design - Question Paper

Thursday, 17 January 2013 10:45Web


The ques. paper is with the attachment.

BE (8th Semester) Examination, 2007

Subject: Digital System Design    Code No. CST ft03/5~

Branch: Computer Science and T.ckotagy Engineering

Time: 3 Hours    Full Marks: 100    V

Answer any five questions

1.


o>

A

B

:x

Z 2


Fig. 1

a)    Find the set of all tests that distinguish the faults a s-a-0 and c s-a-0?    5

b)    Find the set of all tests that distinguish the multiple faults {a s-a-0, b s-a-1} and {c s-a-0, b s-a-1}?    7

c) Find a counter example to the following statement:

8


In a Combinational circuit two faults f and g are functionally equivalent iff they are always detected by the same tests.

2 a. Find the equivalence partition for the machine shown in Table - 1?    10

2 b. Find a minimum length sequence that distinguishes state A from state D? 6

PS

NS, Z

x=o

X=1

A

B, 1

H, 1

B

F, 1

D, 1

C

D, 0

E, 1

D

C, 0

F, 1

E

D, 1

C,1

F

C, 1

C, 1

G

C, 1

D, 1

H

C,0

A, 1

2c. Draw a redundant circuit and explain it with example.    4

G,    G3

Fig 2

a)    Construct Singular Cover and propagation D-cube for the circuit of fig.2.

b)    Find the test set for s-a-0 fault at the line 6 using D-algorithm?

c)    What are the Advantages of PODEM and FAN Algorithm in comparison to D-Algorithm?

a. Find the test set for s-a-0 fault at the line 9 using D-algorithm?    10

Fig.4

b. Find the test set for s-a-0 fault at the line 8 using PODEM algorithm.    10

5. Define Boolean Difference of a function. Use Boolean Difference for finding tests for the function,

F = (X, + X2)X'3 + X3X4 + X,X2

i)    detecting X4 stuck at 0

ii)    detecting X3 stuck at 1

5b. Given the fault table shown in the following figure, where z denotes the fault-free output for the corresponding test.

Find a minimal set of tests to detect all single faults.    10

TABLE 2.

Tests

Faults

z

fl

f2

f3

f4

f5

T1

1

1

1

0

T2

1

1

1

T3

1

1

1

T4

1

0

T5

1

1

6.

5

Fig.5

a) Find the test set for s-a-0 fault at the line 6 using PODEM algorithm.    10

6b.

Fig.6

b) Find the test set for L-SA-1 fault using FAN algorithm


10








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