Thapar University 2007-2nd Year M.E Advanced Techniques for Material Characterization Year - Question Paper
End Semester Examination (May 2007)
MS-106 Advanced Technique for Materials Characterization
NOTE; Attempt all questions in a sequcnec Time : 3 hrs. MM: 36
1.(a) What is AFM? What information do we get from it?
(b) What arc Kikuchi lines? What is its physical significance?
(c) What is the typical diameter of probe in AFM? (2,3,1)
2. (a) With the help of ray diagram explain the working of TEM
(b) What is Moire pattern in TEM? Explain with neat sketch
(c) What is the typical size of fringes obtained for different planes in (2,3,1) TEM?
3.(a) What is dark and bright field microscopy? What are benefits of it? Explain with suitable illustration.
(b) What arc different techniques
(c) What is etchant used for thinning of steel sample in TEM?
(3,2,1)
4. (a) When tw-o dislocations arc moving in different direction which
gel arrested at some point, what will be their structural features observed under TEM? Draw it.
(b) For IICF structure how the dislocation line will appear? Give reason for it.
(c) How the fine screw dislocation will appear in TEM micrograph? (2,2,2) Draw them.
5. (a) How diffusion pump works in SEM? Explain.
(b) What do you mean by filament life? I low it can be enhanced?
(c) What arc SE and BSE? What is their role in imaging system? (3,2,1)
6. (a) The enclosed micrograph Fig. 1 (( a to d) pertain to a failed
sample. Explain the features separately for each one.( Fig.l)
(b) What docs the arrow in fig.2( a & b) indicate? Which type of micrograph arc thcsc(a & b)?.
(c) What do the structural features of fig.2(c &d) arc? Simply try to (3,114, 1 %) recognize them.
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| Earning: Approval pending. |
